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Test Systems

group of interoperable devices whose integration perform a common test purpose.

See Also: Systems, Equipment, System Integrators, System Test, System Integration


Showing results: 1741 - 1755 of 5213 items found.

  • PCI High Density Resistor Card 10-Channel, 16-Bit, 0 To 65k Ohm

    50-295A-121-10/16 - Pickering Interfaces Ltd.

    The 50-295A is a Programmable Resistor card with up to 18-channels of 8-bit resolution resistor chains in a single PCI slot. The flexible architecture allows the card to also be supplied as 12-bit, 16-bit or 24-bit resolution versions for applications requiring finer resolution, greater resistance range or higher channel count. The card is ideal for simulating the sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.

  • PCI High Density Resistor Card 10-Channel, 12-Bit, 0 To 4k Ohm

    50-295A-121-10/12 - Pickering Interfaces Ltd.

    The 50-295A is a Programmable Resistor card with up to 18-channels of 8-bit resolution resistor chains in a single PCI slot. The flexible architecture allows the card to also be supplied as 12-bit, 16-bit or 24-bit resolution versions for applications requiring finer resolution, greater resistance range or higher channel count. The card is ideal for simulating the sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.

  • Tone Generator

    ComTekk Engineering, LLC.

    Control and test 2-way radio systems, repeaters, ANI, Paging and more. Activate 2-tone or 5/6-tone pagers. Operate or test EIA tone-remote systems. Record generated signals to a WAV file Accomplish MORE, by carrying LESS hardware in the field. Monitor inputs and outputs with our FREE built-in audio scope and spectrum analyzer. No external hardware required. Output may be fed directly into radio, twisted pair, or service monitor.*

  • Harmonics And Flicker Measuring System

    ProfLine Series - Teseq AG

    The Teseq ProfLine system is a complete and cost effective Harmonics and Flicker measurement test system which compiles to the latest IEC/EN standards, including IEC 61000-3-2 and IEC 61000-3-3. The programmable power generation capability of up to 45 kVA (90 kVA and 145 kVA sources comprise multiple 45 kVA units) provides more than ample power to cater for a wide range of Equipment Under Test (EUT).

  • Boundary-Scan DIMM Socket Tester

    ScanDIMM - Corelis, Inc.

    Maximizing test coverage is an important piece in test procedure development. Unfortunately, not all designs have the necessary requirements in place to accommodate boundary-scan test methods on memory devices. ScanDIMM digital socket test modules are designed to overcome such limitations when testing DIMM sockets utilizing boundary-scan test techniques.ScanDIMM modules provide the capability to instantly turn any DIMM socket into a fully compliant IEEE-1149.1 device. Integration is as simple as assigning the included BSDL file to the reference designator of the target socket and compiling test vectors.In multi-socket systems, multiple ScanDIMM modules can be linked to provide even greater boundary-scan test depth.

  • MIPI Receiver Test Solution

    M8085A - Keysight Technologies

    The M8085A is a software plug-in for M8070A Bit Error Ratio Test system software within the M8000 series of BER test solutions. The M8085A software plug-in controls either the M8190A or the M8195A Arbitrary Waveform Generators to create C-PHY or D-PHY standard compliant test signals. In addition it provides routines for calibration of all signal parameters and for all tests specified in the applicable Conformance Test Suite. Together with the additional available DUT control interface it is possible to read the BER of the receiver under test from the M8070A software and display the BER dependency from test parameters within the M8070A user interface.

  • Vacuum Probing Systems

    SemiProbe

    Built using our PS4L patented technology, SemiProbe manufactures a family of Vacuum Probing Systems, which test wafers or substrates in a vacuum environment. Additionally, individual die and broken/partial wafers can be tested with the  Vacuum Probing System. All key modules are interchangeable and upgradeable.

  • Burn-In System

    TRIO-TECH International

    The COBIS-II Series Burn-in System is designed to test the latest high frequency integrated circuits (ICs) and combines a large capacity oven with well proven Accutron FlexBID™ dynamic driver technology. This system is engineered for productive dynamic device testing and reliable monitoring.

  • PD Measurement Devices

    Power Diagnostix Systems GmbH

    This group of instruments offer partial discharge measurement functions of different performance level. Devices for test and research laboratories as well as systems for on-site PD analysis are available. Stand alone units, computer controlled systems or wireless operating acquisition sets are shown in this area.

  • RSE Wireless EMC Spurious Emission

    TS8996 - Rohde & Schwarz GmbH & Co. KG

    The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.

  • Intermediate Test Cells

    Atec, Inc.

    Atec’s modular intermediate test cells are the most versatile on the market today. Over the last 40 years the A/M37T-20 jet engine test system developed by Atec and Celtech has become the leading test bed solution for over 15 engines and their variants, including:F100, F101, F110, F119, F124, F125, F404, F414, J85, TF33, TF34, TFE731

  • Cable-End Test Fixtures

    Test Head Engineering, LLC

    Test Head Engineering's cable-end fixtures are used in the production of cable harnesses and in the testing of finished products. They are the long-lasting "connector" to the test system - taking the place of connectors that would quickly exceed their cycle life and produce erratic test results. Cable-end fixtures are used in the automotive and heavy equipment industries, but are also applicable wherever low cycle-life connectors are used - including RF cables.

  • 2-Axis Rate and Position Tables

    ACUTRONIC Switzerland Ltd

    When a device under test needs to be stimulated with simultaneous movements around two axes, then a product from the ACUTRONIC two-axis motion simulator range is the right choice. Due to their independent motion simulation in two axes they are very versatile: they are used as Inertial Guidance Test Systems (IGTS), for HardWare-In-the-Loop (HWIL) testing, for the test of optronic pointing devices, and many more applications.

  • End-Of-The-Line Tester

    Certifier 1200 - LITE-CHECK LLC.

    Presenting a vehicle test station for electrical, brake, and ABS End-Of-The-Line testing from LITE-CHECK, the leader in economical, technician-friendly test equipment. With state of the art software and hardware automatic operations are recorded for a complete printed report of the vehicles electrical and air system. Heavy-duty test station for complete electrical, air brake, ABS, and 121 brake timing & end-of-line testing.

  • MULTI-FUNCTION AVIONICS TEST SET

    TR-220 - Tel-Instrument Electronics Corp.

    The TR-220 provides test capability for Traffic and Collision Avoidance Systems (TCAS), Distance Measuring Equipment (DME) and Transponders (Modes A, C, and S). The TR-220 features state-of-the art design technology. Microprocessor control results in easy-to-use operation that requires minimum amounts of training. Setup menu allows storage of various test parameters to facilitate quick recall of test conditions.

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